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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - On the possibility to detect and visualize electromagnetic coupling paths

✍ Scribed by Li, Hongyu; Khilkevich, Victor; Pommerenke, David; Zhang, Yaojiang; Fan, Jun

Book ID: 115468129
Publisher: IEEE
Year: 2011
Weight: 464 KB
Volume: 0
Category: Article
ISBN: 1457708124
DOI: 10.1109/isemc.2011.6038374

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