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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - A fast analysis of electromagnetic immunity responses of RF amplifier circuit under CW/digital-modulation schemes

✍ Scribed by Hsieh, Han-Chang; Chen, Jay-San; Wang, Chi-Hsueh; Chiu, Cheng-Nan; Lin, Ming-Shing; Chen, Chun Hsiung

Book ID: 120207410
Publisher: IEEE
Year: 2011
Weight: 631 KB
Category: Article
ISBN: 1457708124
DOI: 10.1109/ISEMC.2011.6038404

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