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[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Optimized acquisition geometry for X-ray inspection

✍ Scribed by Frosio, I.; Borghese, N. A.; Lissandrello, F.; Venturino, G.; Rotondo, G.

Book ID: 121326434
Publisher: IEEE
Year: 2011
Weight: 445 KB
Category: Article
ISBN: 1424479339
DOI: 10.1109/IMTC.2011.5944195

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