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[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Uncertainty evaluation in face recognition algorithms

✍ Scribed by Betta, G.; Capriglione, D.; Liguori, C.; Paolillo, A.

Book ID: 125434512
Publisher: IEEE
Year: 2011
Weight: 658 KB
Category: Article
ISBN: 1424479339
DOI: 10.1109/imtc.2011.5944124

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