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[IEEE 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Hangzhou, China (2011.05.10-2011.05.12)] 2011 IEEE International Instrumentation and Measurement Technology Conference - Thickness measurement using transient eddy current techniques

✍ Scribed by Kral, J.; Smid, R.; Ramos, H. M. Geirnhas; Ribeiro, A. Lopes

Book ID: 120660683
Publisher: IEEE
Year: 2011
Weight: 316 KB
Category: Article
ISBN: 1424479339
DOI: 10.1109/IMTC.2011.5944293

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