๐”– Bobbio Scriptorium
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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Ferroelectricity in hafnium oxide: CMOS compatible ferroelectric field effect transistors

โœ Scribed by Boscke, T. S.; Muller, J.; Brauhaus, D.; Schroder, U.; Bottger, U.


Book ID
111874350
Publisher
IEEE
Year
2011
Weight
801 KB
Volume
0
Category
Article
ISBN
1457705044

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