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[IEEE 2011 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Hanzhou, China (2011.12.12-2011.12.14)] 2011 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS) - Polynomial chaos helps assessing parameters variations of PCB lines

✍ Scribed by Manfredi, Paolo; Stievano, Igor S.; Canavero, Flavio G.

Book ID: 111963868
Publisher: IEEE
Year: 2011
Weight: 229 KB
Category: Article
ISBN: 146732289X
DOI: 10.1109/edaps.2011.6213764

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