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[IEEE 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Lake Buena Vista, FL, USA (2011.05.31-2011.06.3)] 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) - Comparison of LED package reliability under thermal cycling and thermal shock conditions by experimental testing and finite element simulation

โœ Scribed by Chen, Zhaohui; Zhang, Qin; Chen, Run; Jiao, Feng; Chen, Mingxiang; Luo, Xiaobing; Liu, Sheng


Book ID
125833155
Publisher
IEEE
Year
2011
Weight
580 KB
Category
Article
ISBN
1612844979

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