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[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Characterization and Physical Modeling of Endurance in Embedded Non-Volatile Memory Technology

✍ Scribed by Garetto, Davide; Zaka, Alban; Manceau, Jean-Philippe; Rideau, Denis; Dornel, Erwan; Clark, William F.; Schmid, Alexandre; Jaouen, Herve; Leblebici, Yusuf

Book ID: 126626685
Publisher: IEEE
Year: 2011
Weight: 501 KB
Category: Article
ISBN: 1457702258
DOI: 10.1109/IMW.2011.5873186

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