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[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - The Effect of Tunnel Barrier at Resistive Switching Device for Low Power Memory Applications

✍ Scribed by Choi, Hyejung; Yi, Jaeyun; Hwang, Sangmin; Lee, Sangkeum; Song, Seokpyo; Lee, Seunghwan; Lee, Jaeyeon; Son, Donghee; Park, Jinwon; Kim, Suk-Ju; Kim, Ja-Yong; Lee, Sunghoon; Moon, Jiwon; Kim, Choidong; Park, Jungwoo; Joo, Moonsig; Roh, JaeSung; Park, Sungki; Chung, Sung-Woong; Rhee, Junghoon; Hong, Sung Joo

Book ID: 111966739
Publisher: IEEE
Year: 2011
Weight: 725 KB
Volume: 0
Category: Article
ISBN: 1457702258
DOI: 10.1109/imw.2011.5873243

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