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[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Investigating the effects of transient faults in Programmable Capacitor Arrays

โœ Scribed by Balen, Tiago R.; Cardoso, Guilherme S.; Goncalez, Odair L.; Lubaszewski, Marcelo S.


Book ID
126622659
Publisher
IEEE
Year
2011
Weight
278 KB
Category
Article
ISBN
1457714892

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