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[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Functional test generation for the pLRU replacement mechanism of embedded cache memories

✍ Scribed by Perez, W. J. H.; Sanchez, E.; Reorda, M. Sonza; Tonda, A.; Medina, J. Velasco

Book ID: 121669900
Publisher: IEEE
Year: 2011
Weight: 190 KB
Category: Article
ISBN: 1457714892
DOI: 10.1109/LATW.2011.5985898

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