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[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis

✍ Scribed by Pasca, Vladimir; Anghel, Lorena; Benabdenbi, Mounir

Book ID: 121489862
Publisher: IEEE
Year: 2011
Weight: 740 KB
Category: Article
ISBN: 1457714892
DOI: 10.1109/LATW.2011.5985896

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