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[IEEE 2011 12th Latin American Test Workshop - LATW - Beach of Porto de Galinhas, Brazil (2011.03.27-2011.03.30)] 2011 12th Latin American Test Workshop (LATW) - Modeling the effect of process variations on the timing response of nanometer digital circuits

✍ Scribed by Freijedo, J.; Semiao, J.; Rodriguez-Andina, J. J.; Vargas, F.; Teixeira, I. C.; Teixeira, J. P.

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