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[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - An integrating analog-to-digital data converter with variable resolution

✍ Scribed by I-Hsin Wang, ; Shen-Iuan Liu,

Book ID: 120165443
Publisher: IEEE
Year: 2010
Weight: 548 KB
Category: Article
ISBN: 1424452694
DOI: 10.1109/VDAT.2010.5496721

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