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[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - Interface electronics for MEMS-based wireless sensing applications

✍ Scribed by Young, Darrin J.

Book ID: 118139794
Publisher: IEEE
Year: 2010
Weight: 476 KB
Volume: 0
Category: Article
ISBN: 1424452694
DOI: 10.1109/vdat.2010.5496708

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