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[IEEE 2010 International Symposium on Next-Generation Electronics (ISNE) - Kaohsiung, Taiwan (2010.11.18-2010.11.19)] 2010 International Symposium on Next Generation Electronics - Efficient VLSI design for SIFT feature description

✍ Scribed by Lin, Yi-Ming; Yeh, Chun-Hsien; Yen, Sheng-Hung; Ma, Ching-Hsuan; Chen, Pei-Yin; Kuo, C.-C. Jay

Book ID: 121849990
Publisher: IEEE
Year: 2010
Weight: 615 KB
Category: Article
ISBN: 1424466938
DOI: 10.1109/ISNE.2010.5669202

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