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[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Image analysis based on an improved bidimensional empirical mode decomposition method

✍ Scribed by Zhang, Dan; Pan, Jianjia; Tang, Yuan Yan

Book ID: 120187966
Publisher: IEEE
Year: 2010
Weight: 711 KB
Category: Article
ISBN: 1424465303
DOI: 10.1109/ICWAPR.2010.5576310

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