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[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Multi-resolution local binary patterns for image classification

✍ Scribed by Liang, Peng; Li, Shao-Fa; Qin, Jiang-Wei

Book ID: 111907798
Publisher: IEEE
Year: 2010
Weight: 636 KB
Volume: 0
Category: Article
ISBN: 1424465303
DOI: 10.1109/icwapr.2010.5576318

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