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[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Image match using distribution of colorful SIFT

✍ Scribed by Zha, Zeng-Shun; Tian, Qing-Ji; Wang, Ji-Zhen; Zhou, Jian-Ming

Book ID: 120066922
Publisher: IEEE
Year: 2010
Weight: 308 KB
Category: Article
ISBN: 1424465303
DOI: 10.1109/ICWAPR.2010.5576305

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