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[IEEE 2010 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2010) - Bologna, Italy (2010.09.6-2010.09.8)] 2010 International Conference on Simulation of Semiconductor Processes and Devices - Fast DNA sequencing via transverse differential conductance

✍ Scribed by He, Yuhui; Scheicher, Ralph H.; Grigoriev, Anton; Ahuja, Rajeev; Long, Shibing; Ji, Zhuoyu; Yu, Zhaoan; Liu, Ming

Book ID: 121195215
Publisher: IEEE
Year: 2010
Weight: 929 KB
Category: Article
ISBN: 1424477018
DOI: 10.1109/SISPAD.2010.5604495

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