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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Complexity of ferroresonance phenomena: sensitivity studies from a single-phase system to three-phase reality

✍ Scribed by Zhang, Rui; Li, Haiyu; Ang, Swee Peng; Wang, Zhongdong

Book ID: 118255349
Publisher: IEEE
Year: 2010
Weight: 529 KB
Volume: 0
Category: Article
ISBN: 1424482836
DOI: 10.1109/ichve.2010.5640838

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