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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Fault nature identification for single-phase adaptive reclosure on double circuit EHV transmission lines with shunt reactors

✍ Scribed by Shang, Liqun

Book ID: 115523454
Publisher: IEEE
Year: 2010
Weight: 225 KB
Volume: 0
Category: Article
ISBN: 1424482836
DOI: 10.1109/ichve.2010.5640714

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