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[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Insulator aging tests with HVAC and HVDC excitation using the tracking wheel tester

✍ Scribed by Holtzhausen, J P; Pieterse, P J; Vermeulen, H J; Limbo, S

Book ID: 115477758
Publisher: IEEE
Year: 2010
Weight: 722 KB
Volume: 0
Category: Article
ISBN: 1424482836
DOI: 10.1109/ichve.2010.5640730

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