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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Redundant core testing on the cell BE microprocessor

✍ Scribed by Iverson, David; Dickinson, Dan; Masson, John; Newman-LaBounty, Christina; Simmons, Daniel; Tanona, William

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