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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - The AB-filling methodology for power-aware at-speed scan testing

✍ Scribed by Chen, Tsung-Tang; Wu, Po-Han; Chen, Kung-Han; Rau, Jiann-Chyi; Tzeng, Shih-Ming

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