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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Low power compression of incompatible test cubes

✍ Scribed by Czysz, D.; Mrugalski, G.; Mukherjee, N.; Rajski, J.; Szczerbicki, P.; Tyszer, J.

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