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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - nGFSIM : A GPU-based fault simulator for 1-to-n detection and its applications

✍ Scribed by Li, Huawei; Xu, Dawen; Han, Yinhe; Cheng, Kwang-Ting; Li, Xiaowei

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