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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Environmental monitoring in grain

✍ Scribed by Parkinson, Graham; Crutchley, Dominic; Green, Peter M; Antoniou, Michalis; Boon, Mathew; Green, Peter N.; Green, Peter R.; Sloan, Robin; York, Trevor

Book ID: 126683485
Publisher: IEEE
Year: 2010
Weight: 970 KB
Category: Article
ISBN: 1424428327
DOI: 10.1109/IMTC.2010.5488046

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