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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Study of magnetic interference on a LVDT prototype

✍ Scribed by Masi, Alessandro; Danisi, Alessandro; Losito, Roberto; Martino, Michele; Spiezia, Giovanni

Book ID: 121717011
Publisher: IEEE
Year: 2010
Weight: 797 KB
Category: Article
ISBN: 1424428327
DOI: 10.1109/imtc.2010.5488091

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