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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Microwave moisture meter for granular and particulate materials

✍ Scribed by Trabelsi, Samir; Nelson, Stuart O.

Book ID: 118136743
Publisher: IEEE
Year: 2010
Weight: 736 KB
Volume: 0
Category: Article
ISBN: 1424428327
DOI: 10.1109/imtc.2010.5488071

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