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[IEEE 2010 IEEE Dallas Circuits and Systems Workshop (DCAS) - Richardson, TX, USA (2010.10.17-2010.10.18)] 2010 IEEE Dallas Circuits and Systems Workshop - Device physics origin and solutions to threshold voltage fluctuations in sub 130 nm CMOS incorporating halo implant

✍ Scribed by Edwards, Hal; Chatterjee, Tathagata; Kassem, Mohamed; Gomez, Gabriel; Hou, Fan-Chi; Wu, Xiaoju

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