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[IEEE 2010 IEEE Dallas Circuits and Systems Workshop (DCAS) - Richardson, TX, USA (2010.10.17-2010.10.18)] 2010 IEEE Dallas Circuits and Systems Workshop - Circuit characterization of low frequency noise in 45nm technology bandgap

✍ Scribed by Srinivasan, P.; Marshall, A.

Book ID: 115468104
Publisher: IEEE
Year: 2010
Weight: 478 KB
Volume: 0
Category: Article
ISBN: 1424495350
DOI: 10.1109/dcas.2010.5955043

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