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[IEEE 2010 IEEE Dallas Circuits and Systems Workshop (DCAS) - Richardson, TX, USA (2010.10.17-2010.10.18)] 2010 IEEE Dallas Circuits and Systems Workshop - 0.6–2.0 V, All-CMOS temperature sensor front-end using bulk-driven technology

✍ Scribed by Block, Scott T.; Li, Yiran; Yang, Yi; Li, Changzhi

Book ID: 120231340
Publisher: IEEE
Year: 2010
Weight: 223 KB
Category: Article
ISBN: 1424495350
DOI: 10.1109/DCAS.2010.5955038

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