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[IEEE 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Austin, TX, USA (2010.10.4-2010.10.6)] 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - On-wafer passives de-embedding based on open-pad and Transmission Line measurement

✍ Scribed by Hamidipour, A.; Jahn, M.; Starzer, F.; Wang, X.; Stelzer, A.

Book ID: 121009296
Publisher: IEEE
Year: 2010
Weight: 720 KB
Category: Article
ISBN: 1424485789
DOI: 10.1109/BIPOL.2010.5667930

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