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[IEEE 2010 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2010) - Washington, DC, USA (2010.10.13-2010.10.15)] 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR) - Comparing one-class and two-class SVM classifiers for normal mammogram detection

✍ Scribed by Elshinawyz, Mona Y.; Badawyy, Abdel-Hameed A.; Abdelmageedyy, Wael W.; Chouikhaz, Mohamed F.

Book ID: 125544095
Publisher: IEEE
Year: 2010
Weight: 320 KB
Category: Article
ISBN: 1424488338
DOI: 10.1109/AIPR.2010.5759708

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