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[IEEE 2010 IEEE Applied Imagery Pattern Recognition Workshop (AIPR 2010) - Washington, DC, USA (2010.10.13-2010.10.15)] 2010 IEEE 39th Applied Imagery Pattern Recognition Workshop (AIPR) - Classification of levees using polarimetric Synthetic Aperture Radar (SAR) imagery

✍ Scribed by Dabbiru, Lalitha; Aanstoos, James V.; Younan, Nicolas H.

Book ID: 124149222
Publisher: IEEE
Year: 2010
Weight: 758 KB
Category: Article
ISBN: 1424488338
DOI: 10.1109/AIPR.2010.5759703

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