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[IEEE 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06) - Washington, DC, USA (2006.10.11-2006.10.13)] 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06) - Robust Adjusted Likelihood Function for Image Analysis

✍ Scribed by Duan, Rong; Jiang, Wei; Man, Hong

Book ID: 120637793
Publisher: IEEE
Year: 2006
Weight: 264 KB
Category: Article
ISBN-13: 9780769527390
DOI: 10.1109/AIPR.2006.34

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