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[IEEE 2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE) - San Jose, CA, USA (2010.11.1-2010.11.4)] 2010 IEEE 21st International Symposium on Software Reliability Engineering - A Multi-factor Software Reliability Model Based on Logistic Regression

✍ Scribed by Okamura, Hiroyuki; Etani, Yusuke; Dohi, Tadashi

Book ID: 127106971
Publisher: IEEE
Year: 2010
Weight: 331 KB
Category: Article
ISBN: 1424490561
DOI: 10.1109/issre.2010.14

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