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[IEEE 2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE) - San Jose, CA, USA (2010.11.1-2010.11.4)] 2010 IEEE 21st International Symposium on Software Reliability Engineering - Automatic Mutation Test Case Generation via Dynamic Symbolic Execution

✍ Scribed by Papadakis, Mike; Malevris, Nicos

Book ID: 120532260
Publisher: IEEE
Year: 2010
Weight: 401 KB
Category: Article
ISBN: 1424490561
DOI: 10.1109/ISSRE.2010.38

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