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[IEEE 2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE) - San Jose, CA, USA (2010.11.1-2010.11.4)] 2010 IEEE 21st International Symposium on Software Reliability Engineering - Propagating Bug Fixes with Fast Subgraph Matching

✍ Scribed by Sun, Boya; Shu, Gang; Podgurski, Andy; Li, Shirong; Zhang, Shijie; Yang, Jiong

Book ID: 120408565
Publisher: IEEE
Year: 2010
Weight: 472 KB
Category: Article
ISBN: 1424490561
DOI: 10.1109/ISSRE.2010.36

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