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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Thermal ageing predictions of polymeric insulation cables from Arrhenius plot using short-term test values

✍ Scribed by Ramteke, P. K.; Ahirwar, A. K.; Shrestha, N. B.; Sanyasi Rao, V. V. S.; Vaze, K.K.; Ghosh, A. K.

Book ID: 120615717
Publisher: IEEE
Year: 2010
Weight: 565 KB
Category: Article
ISBN: 1424483441
DOI: 10.1109/ICRESH.2010.5779569

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