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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Critical issues pertaining to the evaluation of passive system reliability

✍ Scribed by Nayak, A. K.; Jain, Vikas; Saha, D.

Book ID: 121010710
Publisher: IEEE
Year: 2010
Weight: 543 KB
Category: Article
ISBN: 1424483441
DOI: 10.1109/ICRESH.2010.5779631

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