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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Databases and their analysis for applications in quantitative risk analysis of NPP

โœ Scribed by Rastogi, Upkar; Jain, V.K.; Srinivas, G.; Guptan, Rajee


Book ID
120009276
Publisher
IEEE
Year
2010
Weight
346 KB
Category
Article
ISBN
1424483441

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