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[IEEE 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Mumbai, India (2010.12.14-2010.12.16)] 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) - Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques

✍ Scribed by Patil, Nishad; Menon, Sandeep; Das, Diganta; Pecht, Michael

Book ID: 115484197
Publisher: IEEE
Year: 2010
Weight: 840 KB
Volume: 0
Category: Article
ISBN: 1424483441
DOI: 10.1109/icresh.2010.5779635

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