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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A structured and scalable test access architecture for TSV-based 3D stacked ICs

✍ Scribed by Marinissen, Erik Jan; Verbree, Jouke; Konijnenburg, Mario

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