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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects

✍ Scribed by Shi, Yiwen; Hu, Wan-Chan; Dworak, Jennifer

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