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[IEEE 2010 18th Biennial University/ Government/Industry Micro/Nano Symposium (UGIM) - West Lafayette, IN, USA (2010.06.28-2010.07.1)] 2010 18th Biennial University/Government/Industry Micro/Nano Symposium - A Theoretical Study of Negative Bias Temperature Instability in p-Type NEMFET

✍ Scribed by Jain, Ankit; Islam, Ahmad Ehteshamul; Alam, Muhammad Ashraful

Book ID: 126749198
Publisher: IEEE
Year: 2010
Weight: 273 KB
Category: Article
ISBN: 1424447313
DOI: 10.1109/UGIM.2010.5508940

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