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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism

✍ Scribed by Zhang, Xiao; Kerkhoff, Hans G.; Vermeulen, Bart

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