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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A low-cost and scalable test architecture for multi-core chips

✍ Scribed by Chi, Chun-Chuan; Wu, Cheng-Wen; Li, Jin-Fu

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